Laung-Terng Wang
Wang Laung-Terng, Stroud Charles E., Touba Nur:
System-On-Chip Test Architectures
Nanometer Design For Testability
Elsevier Science & Technology (United States), 2008
Hardback, 896 pages
Wang Laung-Terng, Wu Cheng-Wen, Wen Xiaoqing:
VLSI Test Principles and Architectures: Design for Testability
Morgan Kaufmann Series In Systems On Silicon (Hardcover)
Morgan Kaufmann Publishers , 2006
Hardcover, 808 pages
Electronic Design Automation
Synthesis, Verification, And Test
Editor: Laung-Terng Wang
Elsevier Science & Technology (United States)
Hardback, 960 pages



