Eruditor.com > Laung-Terng Wang

Laung-Terng Wang

Wang Laung-Terng, Stroud Charles E., Touba Nur:
System-On-Chip Test Architectures

Nanometer Design For Testability
Elsevier Science & Technology (United States), 2008
Hardback, 896 pages

Our price: £33.99
List price: £39.99
You save: 15%

In stock: Usually ships within 24 hours.

Will be shipped from: United Kingdom or United States
 Add to Shopping Basket 

Wang Laung-Terng, Wu Cheng-Wen, Wen Xiaoqing:
VLSI Test Principles and Architectures: Design for Testability

Morgan Kaufmann Series In Systems On Silicon (Hardcover)
Morgan Kaufmann Publishers , 2006
Hardcover, 808 pages

Not available
Sorry,the image is not available

Electronic Design Automation

Synthesis, Verification, And Test
Editor: Laung-Terng Wang
Elsevier Science & Technology (United States)
Hardback, 960 pages

Our price: £44.99
List price: £49.99
You save: 10%
Not yet published
© 2006-2008 Eruditor Ltd and its partners
McAfee Secure sites help keep you safe from identity theft, credit card fraud, spyware, spam, viruses and online scams

Search

Advanced Search

Browse

Authors’ Name Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z