Kenneth Pye
Pye Kenneth:
Geological And Soil Evidence
Forensic Applications
Taylor & Francis Ltd (United States), 2007
Hardback, 356 pages
Krinsley David H., Pye Kenneth, Boggs Sam, Tovey N. Keith:
Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks
New Ed
Cambridge University Press (United Kingdom), 2005
Paperback, 203 pages
Krinsley David H., Pye Kenneth, Boggs Sam, Tovey N. Keith:
Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks
Cambridge University Press (United Kingdom), 1998
Hardback, 203 pages

