Seebauer Edmund G., Kratzer Meredith C.:
Charged Semiconductor Defects
Springer London Ltd (United Kingdom), 2008
Hardback, 308 pages
Size: 235x155 mm
ISBN: 9781848820586
ISBN-10: 1848820585
List price: £94.50
You save: 15%
Charged Semiconductor Defects
Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of 'defect engineering'. This book covers the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.

