Seebauer Edmund G., Kratzer Meredith C.:
Charged Semiconductor Defects

Springer London Ltd (United Kingdom), 2008
Hardback, 308 pages
Size: 235x155 mm
ISBN: 9781848820586
ISBN-10: 1848820585

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Charged Semiconductor Defects

Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of 'defect engineering'. This book covers the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.

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Edmund G. Seebauer
Meredith C. Kratzer
Condensed matter physics (liquids & solids)
States of matter
Physics
Mathematics and science
Springer London Ltd

More information from Wikipedia:

Edmund G. Seebauer
Meredith C. Kratzer
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