Pavlov Andrei, Sachdev Manoj:
Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies
Process-Aware Sram Design And Test
Springer-Verlag New York Inc. (United States), 2008
Hardback, 212 pages
Size: 235x155 mm
ISBN: 9781402083624
ISBN-10: 1402083629
List price: £89.99
You save: 15%
Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies
Covers a broad range of topics related to SRAM design and test. This book places emphasis on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

