Pavlov Andrei, Sachdev Manoj:
Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies

Process-Aware Sram Design And Test

Springer-Verlag New York Inc. (United States), 2008
Hardback, 212 pages
Size: 235x155 mm
ISBN: 9781402083624
ISBN-10: 1402083629

Our price: £76.49
List price: £89.99
You save: 15%

Usually ships in 2-4 working days.

Will be shipped from: United Kingdom
 Add to Shopping Basket 

Cmos Sram Circuit Design And Parametric Test In Nano-Scaled Technologies

Covers a broad range of topics related to SRAM design and test. This book places emphasis on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies.

Related links:

Andrei Pavlov
Manoj Sachdev
Circuits & components
Electronics engineering
Electronics & communications engineering
Technology, engineering, agriculture, veterinary science
Springer-Verlag New York Inc.

More information from Wikipedia:

Andrei Pavlov
Manoj Sachdev
© 2006-2009 Eruditor Ltd and its partners

Search

Whole catalogue
Universities / polytechnics

Advanced Search

Browse

Authors’ Name Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Share |