Redfield David, Bube Richard H.:
Photo-Induced Defects In Semiconductors

Series editor: HaroonAhmad

Cambridge University Press (United Kingdom), 2006
Paperback, 232 pages
Size: 229x152 mm
ISBN: 9780521024457
ISBN-10: 0521024455

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Photo-Induced Defects In Semiconductors

A thorough review of the properties of deep-level, localized defects in semiconductors.

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David Redfield
Richard H. Bube
Haroon Ahmad
Electricity, magnetism & electromagnetism
Physics
Mathematics and science
Cambridge University Press

More information from Wikipedia:

David Redfield
Richard H. Bube
Haroon Ahmad
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