Redfield David, Bube Richard H.:
Photo-Induced Defects In Semiconductors
Series editor: HaroonAhmad
Cambridge University Press (United Kingdom), 2006
Paperback, 232 pages
Size: 229x152 mm
ISBN: 9780521024457
ISBN-10: 0521024455
List price: £24.99
You save: 5%
Photo-Induced Defects In Semiconductors
A thorough review of the properties of deep-level, localized defects in semiconductors.


