Krinsley David H., Pye Kenneth, Boggs Sam, Tovey N. Keith:
Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks

Cambridge University Press (United Kingdom), 2005
Paperback, 204 pages
Size: 261x207 mm
ISBN: 9780521019743
ISBN-10: 0521019745

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N. Keith Tovey

University Of East Anglia

Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks

A concise summary that uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields. Lucidly written, this book will be ideal for researchers and graduate students.

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David H. Krinsley
Kenneth Pye
Sam Boggs
N. Keith Tovey
Petrology
Geology & the lithosphere
Earth sciences
Earth sciences, geography, environment, planning
Cambridge University Press

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David H. Krinsley
Kenneth Pye
Sam Boggs
N. Keith Tovey
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