Krinsley David H., Pye Kenneth, Boggs Sam, Tovey N. Keith:
Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks
Cambridge University Press (United Kingdom), 2005
Paperback, 204 pages
Size: 261x207 mm
ISBN: 9780521019743
ISBN-10: 0521019745
List price: £27.00
You save: 5%
N. Keith Tovey
University Of East Anglia
Backscattered Scanning Electron Microscopy And Image Analysis Of Sediments And Sedimentary Rocks
A concise summary that uses abundant images to illustrate the type of information backscattered scanning electron microscopy (BSE) yields. Lucidly written, this book will be ideal for researchers and graduate students.


