Janssens K., Etc., Adams F., Rindby A.:
Microscopic X-Ray Fluorescence Analysis

John Wiley And Sons Ltd (United Kingdom), 2000
Paperback, 434 pages
Size: 235x155 mm
ISBN: 9780471974260
ISBN-10: 0471974269

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A. Rindby

Chalmers University Of Technology, Swenden

Microscopic X-Ray Fluorescence Analysis

-XRF analysis is a recently developed, highly sensitive analytical technique. This topical publication provides a detailed overview of the applications of -XRF in industrial and academic circles.

Related links:

K. Janssens
Etc.
F. Adams
A. Rindby
Industrial applications of scientific research & technological innovat
Science: general issues
Mathematics and science
John Wiley And Sons Ltd

More information from Wikipedia:

K. Janssens
Etc.
F. Adams
A. Rindby
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