Ker Ming-Dou, Hsu Sheng-Fu:
Transient-Induced Latchup In Cmos Integrated Circuits
John Wiley And Sons Ltd (United Kingdom), 2009
Hardback, 272 pages
Size: 244x168 mm
ISBN: 9780470824078
ISBN-10: 0470824077
List price: £95.00
You save: 10%
Transient-Induced Latchup In Cmos Integrated Circuits
Introduces the phenomenon and basic physical mechanism of latchup, explaining the critical issues that have resurfaced for CMOS technologies. This book discusses the physical mechanism of TLU under a system-level ESD test, while introducing an efficient component-level TLU measurement setup.

