Alford Terry L., Feldman L.C., Mayer James W.:
Fundamentals Of Nanoscale Film Analysis

Springer-Verlag New York Inc. (United States), 2007
Hardback, 350 pages
Size: 235x155 mm
ISBN: 9780387292601
ISBN-10: 0387292608

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L.C. Feldman

Vanderbilt University

Fundamentals Of Nanoscale Film Analysis

Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. This work concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It also presents a variety of analytical and scanning probe microscopy techniques.

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Terry L. Alford
L.C. Feldman
James W. Mayer
Analytical chemistry
Chemistry
Mathematics and science
Springer-Verlag New York Inc.

More information from Wikipedia:

Terry L. Alford
L.C. Feldman
James W. Mayer
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