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Egerton Ray:
Physical Principles Of Electron Microscopy

An Introduction To Tem, Sem, And Aem

Springer-Verlag New York Inc. (United States), 2008
Hardback, 214 pages
Size: 246x155 mm
ISBN: 9780387258003
ISBN-10: 0387258000

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Physical Principles Of Electron Microscopy

Scanning and stationary-beam electron microscopes have become an indispensable tool for research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and practice of electron microscopy.

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Ray Egerton
Microscopy
Scientific equipment & techniques, laboratory equipment
Science: general issues
Mathematics and science
Springer-Verlag New York Inc.

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