Egerton Ray:
Physical Principles Of Electron Microscopy
An Introduction To Tem, Sem, And Aem
Springer-Verlag New York Inc. (United States), 2008
Hardback, 214 pages
Size: 246x155 mm
ISBN: 9780387258003
ISBN-10: 0387258000
You save: 10%
Physical Principles Of Electron Microscopy
Scanning and stationary-beam electron microscopes have become an indispensable tool for research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book provides an introduction to the theory and practice of electron microscopy.
