Lee Yang W., Pipino Leo L., Funk James D., Wang Richard Y.:
Journey To Data Quality

Mit Press Ltd (United States), 2009
Paperback, 240 pages
Size: 229x152 mm
ISBN: 9780262513357
ISBN-10: 0262513358

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Yang W. Lee

Northeastern University, Boston, Massachusetts, USA

Journey To Data Quality

A guide for assessing an organization's data quality practice and a roadmap for implementing a viable data and information quality management program, based on rigorous research and drawing on real-world examples.

Related links:

Yang W. Lee
Leo L. Pipino
James D. Funk
Richard Y. Wang
General theory of computing
Computing and information technology
Mit Press Ltd

More information from Wikipedia:

Yang W. Lee
Leo L. Pipino
James D. Funk
Richard Y. Wang
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