Lee Yang W., Pipino Leo L., Funk James D., Wang Richard Y.:
Journey To Data Quality
Mit Press Ltd (United States), 2009
Paperback, 240 pages
Size: 229x152 mm
ISBN: 9780262513357
ISBN-10: 0262513358
List price: £13.95
You save: 15%
Yang W. Lee
Northeastern University, Boston, Massachusetts, USA
Journey To Data Quality
A guide for assessing an organization's data quality practice and a roadmap for implementing a viable data and information quality management program, based on rigorous research and drawing on real-world examples.

